(2018). Lock-in Thermography: Basics and Use for Evaluating Electronic Devices and Materials / by Otwin Breitenstein, Wilhelm Warta, Martin C. Schubert.
Chicago (17e ed.) BronvermeldingLock-in Thermography: Basics and Use for Evaluating Electronic Devices and Materials / by Otwin Breitenstein, Wilhelm Warta, Martin C. Schubert. 2018.
MLA (9e ed.) BronvermeldingLock-in Thermography: Basics and Use for Evaluating Electronic Devices and Materials / by Otwin Breitenstein, Wilhelm Warta, Martin C. Schubert. 2018.
Let op: Deze citaties zijn niet altijd 100% accuraat.