תצוגת צוות: Lock-in Thermography : Basics and Use for Evaluating Electronic Devices and Materials / by Otwin Breitenstein, Wilhelm Warta, Martin C. Schubert.

Summary goes here

שמור ב:

מידע ביבליוגרפי
פורמט:	ספר
שפה:	אנגלית
נושאים:	Lasers. Photonics. Materials science. Microwaves. Optical engineering. Structural materials. Optics, Lasers, Photonics, Optical Devices. Characterization and Evaluation of Materials. Microwaves, RF and Optical Engineering. Structural Materials.
תגים:	הוספת תג אין תגיות, היה/י הראשונ/ה לתייג את הרשומה!

era
format	Book
genre
geographic
id	2dd55cb9-d91f-4b09-9938-3ca775e8e2b6
isbn	3-319-99825-0
issn
language	eng
physical	1 online resource (339 pages)
publication	– publisher: Springer International Publishing dateOfPublication: 2018
publishDate	2018
subjects
title	Lock-in Thermography : Basics and Use for Evaluating Electronic Devices and Materials / by Otwin Breitenstein, Wilhelm Warta, Martin C. Schubert.
topic	Lasers. Photonics. Materials science. Microwaves. Optical engineering. Structural materials. Optics, Lasers, Photonics, Optical Devices. Characterization and Evaluation of Materials. Microwaves, RF and Optical Engineering. Structural Materials.