Summary goes here
Salvato in:
| Natura: | Libro |
|---|---|
| Lingua: | inglese |
| Soggetti: | |
| Tags: |
Aggiungi Tag
Nessun Tag, puoi essere il primo ad aggiungerne!!
|
| era | |
|---|---|
| format | Book |
| genre | |
| geographic | |
| id | 4befff0f-b8e4-4e95-b1c7-65fccc6b1712 |
| isbn | |
| issn | |
| language | eng |
| physical | xii, 53 leaves :illustrations ;29 cm |
| publication | |
| publishDate | 1998 |
| subjects | |
| title | Precision lattice parameter measurements using a standard double axis x-ray diffractometer / by Mark A. Davidson. |
| topic | X-ray diffractometer. Crystal growth. Materials science and engineering |