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| Format: | Książka |
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| Język: | angielski |
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| era | |
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| format | Book |
| genre | |
| geographic | |
| id | 54f287c0-72b7-4f3c-b3c4-752a0dde7a35 |
| isbn | 0780310624 9780780310629 |
| issn | |
| language | eng |
| physical | xviii, 652 pages :illustrations ;25 cm |
| publication | – publisher: IEEE Press dateOfPublication: ©1990 |
| publishDate | ©1990 |
| subjects | |
| title | Digital systems testing and testable design / Miron Abramovici, Melvin A. Breuer, Arthur D. Friedman. |
| topic | Digital integrated circuits Digital integrated circuits Digital integrated circuits Digital integrated circuits |