Diğer Bilgiler: Records of the 1995 IEEE International Workshop on Memory Technology, Design, and Testing, August 7-8, 1995, San Jose, California / edited by R. Rajsuman and K. Rajkanan ; sponsored by the IEEE Computer Society Technical Committee on Test Technology, the IEEE Computer Society Technical Committee on VLSI, in cooperation with the IEEE Solid State Circuits Council.

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Detaylı Bibliyografya
Materyal Türü:	Kitap
Dil:	İngilizce
Konular:	Semiconductor storage devices Random access memory
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