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| Format: | Buch |
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| Sprache: | Englisch |
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| format | Book |
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| id | 91b703c5-81fa-4697-aee2-ea263bf14c65 |
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| language | eng |
| physical | volumes :illustrations ;28 cm |
| publication | – publisher: Dept of Energy dateOfPublication: 1978 |
| publishDate | 1978 |
| subjects | |
| title | X-ray measurements of stresses and defects in EFG and large grained polycrystalline silicon ribbons. |
| topic | Silicon Residual stresses. internal stress. Residual stresses |