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Tallennettuna:
| Aineistotyyppi: | Kirja |
|---|---|
| Kieli: | englanti |
| Aiheet: | |
| Tagit: |
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| era | |
|---|---|
| format | Book |
| genre | |
| geographic | |
| id | 9da9ddd3-b34b-445f-a363-8a386d0bee43 |
| isbn | 9780123739735 012373973X |
| issn | |
| language | eng |
| physical | xxxvi, 856 pages :illustrations ;25 cm. |
| publication | – publisher: Morgan Kaufmann Publishers dateOfPublication: ©2008 |
| publishDate | ©2008 |
| subjects | |
| title | System-on-chip test architectures : nanometer design for testability / edited by Laung-Terng Wang, Charles E. Stroud, Nur A. Touba. |
| topic | Systems on a chip Integrated circuits Integrated circuits Integrated circuits Integrated circuits |