(1998). Random testing of digital circuits: Theory & application / René David ; in cooperation with Mireille Jacomino and Pascale Thevenod ; with a foreword by Thomas W. Williams.
Cita Chicago (17th ed.)Random Testing of Digital Circuits: Theory & Application / René David ; in Cooperation with Mireille Jacomino and Pascale Thevenod ; with a Foreword by Thomas W. Williams. 1998.
Cita MLA (9th ed.)Random Testing of Digital Circuits: Theory & Application / René David ; in Cooperation with Mireille Jacomino and Pascale Thevenod ; with a Foreword by Thomas W. Williams. 1998.
Atenció: Aquestes cites poden no estar 100% correctes.