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| Format: | Buch |
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| Sprache: | Englisch |
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| format | Book |
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| id | b83c7d5c-06a9-4971-956e-ff013900a2f2 |
| isbn | 0824701828 (alk. paper) |
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| language | eng |
| physical | pages ;cm. |
| publication | – publisher: Marcel Dekker dateOfPublication: c1998 |
| publishDate | c1998 |
| subjects | |
| title | Random testing of digital circuits : theory & application / René David ; in cooperation with Mireille Jacomino and Pascale Thevenod ; with a foreword by Thomas W. Williams. |
| topic | Digital integrated circuits |