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| Format: | Livre |
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| Langue: | anglais |
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| era | |
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| format | Book |
| genre | |
| geographic | |
| id | ce7db6fa-6110-48fb-9fa3-5fbc48daa289 |
| isbn | |
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| language | eng |
| physical | xvi, 361 pages :illustrations ;27 cm. |
| publication | – publisher: US Dept of Commerce National Bureau of Standards dateOfPublication: 1980 |
| publishDate | 1980 |
| subjects | |
| title | Comprehensive test pattern and approach for characterizing SOS technology / W.E. Ham ; supported by the Defense Advanced Research Projects Agency. |
| topic | Integrated circuits Integrated circuits Integrated circuits Integrated circuits |