Summary goes here
Bewaard in:
| Formaat: | Boek |
|---|---|
| Taal: | Engels |
| Onderwerpen: | |
| Tags: |
Voeg label toe
Geen labels, Wees de eerste die dit record labelt!
|
| era | |
|---|---|
| format | Book |
| genre | |
| geographic | |
| id | dfeb4f79-cb2b-435a-9fcb-a978618d91d2 |
| isbn | |
| issn | |
| language | eng |
| physical | 1 volume |
| publication | – publisher: National Aeronautics and Space Administration Langley Research Center dateOfPublication: 1985 |
| publishDate | 1985 |
| subjects | |
| title | Integrated analysis of error detection and recovery / Kang G. Shin and Yann-Hang Lee. |
| topic | Computational complexity. Computer programs. Error analysis (Mathematics) Error-correcting codes (Information theory) Fault-tolerant computing. Software Complexité de calcul (Informatique) Logiciels. Théorie des erreurs. Codes correcteurs d'erreurs (Théorie de l'information) Tolérance aux fautes (Informatique) software. Computational complexity Computer programs Error analysis (Mathematics) Error-correcting codes (Information theory) Fault-tolerant computing Computation. Computer programs. Error analysis. Error detection codes. Fault tolerance. |